Organizers: Neus Domingo, Sabine Neumayer, Stephen Jesse
Brief description: The Functional Atomic Force Microscopy (FAFM) group at the Center for Nanophase Materials Sciences (CNMS) is dedicated to advancing the capabilities of scanning probe microscopies. Our team works on exploring new ways to use the sharp and mobile tip of the AFM to induce concentrated strain, electrical, thermal, electromagnetic and other fields at the surface of material. In this workshop we will present some of our newest capabilities and the most recent scientific breakthroughs we have achieved by measuring electro-mechanical signals at the nanoscale and we will discuss on the opportunities and challenges of piezoresponse force microscopy.
