11–14 Aug 2025
Crowne Plaza Knoxville
US/Eastern timezone

Connecting electrochemical AFM techniques and traditional impedance spectroscopy

Not scheduled
20m
Crowne Plaza Knoxville

Crowne Plaza Knoxville

401 W Summit Hill Dr SW, Knoxville, TN 37902
Poster Only

Speaker

John Kaman (Lehigh University)

Description

A number of scanning probe-based techniques have been used to study electrochemical behavior of materials on the nanoscale, but it is difficult to apply a generalized description to their results. Crystalline Sb$_2$S$_3$, an optical and electrical phase change material, is an example of a material that shows a strong electrostatic response in scanning probe experiments, where glassy Sb$_2$S$_3$ shows no such response. Here, with a generalized approach, we show a close similarity between frequency-domain impedance spectroscopy measurements and time-domain electrical scanning probe experiments. It is shown that dynamics from surface probe techniques correspond to the same low-frequency dielectric behavior as measured in bulk, on the macroscale. Using the distinctly different electrical characteristics of glassy and crystalline Sb$_2$S$_3$, we show that it can be used to probe local dielectric characteristics with high sensitivity and spatial resolution. We identify characteristics of this material system that enables this comparison as well as the limitations of the approach.

Topical Area Hard matter: quantum, electronic, semiconducting materials

Authors

Co-authors

Kyle Kelley (Center for Nanophase Materials Sciences, Oak Ridge National Laboratory) Dr Neus Domingo Marimon (Oak Ridge National Laboratory)

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